Statistical Process Control & Process Capability

Course "Statistical Process Control & Process Capability" has been pre-approved by RAPS as eligible for up to 12 credits towards a participant's RAC recertification upon full completion.

GlobalCompliancePanel Refer a Friend Program: Any Customer to 3 Referrals "Can Participate 2 Days Seminar for free of Cost

Overview:

This course teaches participants the fundamental concepts and methods needed to establish effective control charts and estimate process capability. In addition to learning traditional control charts (e.g. xbar, r/s), participants will be exposed to other useful charts for handling multiple sources of variation (within/between) and short production runs. Practical aspects of implementing SPC on the shop floor are also discussed.

Estimating process capability for both normal and non-normal data is discussed. The meaning and limitations of popular capability are presented in detail.

This highly interactive course will allow participants the opportunity to practice applying SPC techniques with various data sets. The objective is to provide participants with the key tools and knowledge to be able to apply the methods effectively for their own processes.

Why should you attend?

Understand SPC terminology and basic concepts
Implement traditional control charts for variable and attribute data
Diagnose control charts to detect process instability
Ensure appropriate sampling strategies and sample sizes
Choose the correct type of chart for various applications
Estimate Process Capability (For Normal and Non-Normal Data)
Understand limitations of popular capability indices (Cp, Cpk)
Develop awareness of specialized charting techniques and when to use them
Be able to make immediate improvements in the implementation of SPC in your organization

Who will benefit:

Quality & Process Engineers
Quality Technicians
SPC Supervisors
Production Supervisors
Personnel involved in process development and validation
Laboratory Personnel
Manufacturing/Operations Personnel
Process Improvement Personnel
Supplier Quality Personnel

Agenda

Day 1 Schedule:

Lecture 1:

Variation Fundamentals

Concept of Variation
Data Types
The Normal Distribution
Control Chart Concepts/Examples
Control Limits vs. Specification Limits
Definition of Control/Stability

Lecture 2:

Variation Fundamentals (cont'd)

Definition of Quality
Sources of Variation
Process Capability Concepts
Quality Control vs. Process Control
Basic Statistics
Individuals, Averages, and the Central Limit Theorem

Lecture 3:

Traditional Control Charts

Constructing Charts (Variable Data)
Xbar/R, Xbar/S, I-MR Charts
Chart Signals for Special Causes
Interpreting Charts
Type I and Type II Errors

Lecture 4:

Traditional Control Charts

Re-computing Control Limits
Sampling Procedures and Frequency
Rational Samples
Chart Sensitivity / Sample Size
Determining Appropriate Sample Sizes
Control Chart Selection

Day 2 Schedule:

Lecture 1:

Process Capability

Stability vs. Capability
Types of Capability Assessments
Estimating PPM / Proportion Defective
The Standard Normal (Z Values)

Lecture 2:

Process Capability (cont'd)

Capability Indices: Cp, Cpk, Pp, Ppk
Interpreting Indices
Process Capability for Non-Normal Data

Lecture 3:

Other Control Charts

Charts for Attribute Data
Charts for Short Production Runs

Lecture 4:

Other Control Charts

Within/Between Charts (Multiple Locations)
CUSUM Charts

Speaker:

Steven Wachs

Principal Statistician, Integral Concepts, Inc.

Steven Wachs has 25 years of wide-ranging industry experience in both technical and management positions. Steve has worked as a statistician at Ford Motor Company where he has extensive experience in the development of statistical models, reliability analysis, designed experimentation, and statistical process control.

Steve is currently a Principal Statistician at Integral Concepts, Inc. where he assists manufacturers in the application of statistical methods to reduce variation and improve quality and productivity. He also possesses expertise in the application of reliability methods to achieve robust and reliable products as well as estimate and reduce warranty.

Education

M.A., Applied Statistics, University of Michigan, 2002

M.B.A, Katz Graduate School of Business, University of Pittsburgh, 1992

B.S., Mechanical Engineering, University of Michigan, 1986

Location: SFO, CA Date: April 28th & 29th, 2016 and Time: 9:00 AM to 6:00 PM

Venue: DoubleTree by Hilton Hotel San Francisco Airport

Address: 835 Airport Blvd., Burlingame CA 94010-9949

Price: Register now and save $200. (Early Bird)

Price: $1,295.00 (Seminar for One Delegate)

Until March 20, Early Bird Price: $1,295.00 from March 21 to April 26, Regular Price: $1,495.00

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